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OXFORD NANO-MASTER

  • 1. OXFORD NANO-MASTER
Price:
$8,800.00
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New
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Product Description

OXFORD NANO-MASTER

The NANO-MASTER is an innovative µ-XRF benchtop analyser for the measurement of the latest generation of very small electronic components and thin coatings using standardless analysis down to the nanometre scale.

The NANO-MASTER has the lowest limits of detection and allows component compliance testing to  RoHS, WEEE, ELV specifications.

Highlighs

  • High resolution Peltier cooled Si-PIN detector for simple element identification
  • HiSpex digital pulse processing for the greatest X-ray flux and minimal analysis time
  • X-ray beam down to <25 µm for the smallest spot analysis
  • Vacuum measuring chamber for an extended element range from 13Al to 92U

OPERATING SOFTWARE:

The operating software X-Master is used highly successfully with a huge number of applications, new ones are constantly added.

Optional software modules:

  • µ-Master for coating thickness measurement
  • Element-Master for standard-free qualitative and quantitative material analysis of up to 20 elements, simultaneously
  • %-Master for precise quantitative material simultaneous analysis of up to 8 elements with statistics
  • Report-Master for customised reporting
  • Data-Master for database management and long-term documentation
  • Liquid-Master for bath solutions

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